User can have the following options. 1. -l :Log data to file. 2. -c :Specify the card to be tested. 3. -I :Iteration number 4. -t :Disable tests 5. -T :Enable tests 6. -r : Input radix 7. -lbm : Option to specify number of packets in Mac Loopback test 8. -lbp : Option to specify number of packets in Phy Loopback test 9. -lbh : Option to specify number of packets in 100BT External Loopback test 10. -lbt : Option to specify number of packets in 10BT External Loopback test 11. -info : Option to display Dev ID Ven ID SVen ID SSystem ID 12. -elog : Produces a log file with only error information 13. -x : Force to search device by using Vendor ID Example: > b44udiag -l test.log -c 1 -I 2 -t A3 -lbm 3000 -lbp 3000 -lbh 3000 -lbt 3000 > b44udiag -x When the Device ID gets changed to something unrecognized, -x option switch allow b44diag to search device by vendor ID. There are 3 groups of test. Each group has a few sub tests. Group A A1. Indirect Control Register Test A2. Direct Control Register Test A3. Interrupt test A4. Built In Self Test A5. CAM Read/Write Test Group B B1. LEDs test B2. EEPROM Test B3. MII Test B4. Link Status Test Group C C1. MAC Loopback Test C2. PHY Loopback Test. C3. External Loopback Test 100BT. C4. External Loopback Test 10BT. C5. PHY Loopback Test w/ CAM Enabled. C6. External Loopback Test 100BT w/ CAM Enabled. C7. External Loopback Test 10BT w/ CAM Enabled. C8 MIB MAC Loopback Test Test Descriptions A1. Indirect Register Test Command: regtest -i Function: Each Register specified in the configuration contents read only bit and read/write bit defines. The test writing zero and one by using indirect addressing method into the test bits to insure the read only bits are not changed, and read/write bits are changed accordingly. Default: Enabled A2 Control Register Test Command: regtest Function: Each Register specified in the configuration contents read only bit and read/write bit defines. The test writing zero and one into the test bits to insure the read only bits are not changed, and read/write bits are changed accordingly. Default: Enabled A3 Interrupt Test Command: intrtest Function: This test verifies the interrupt functionality. It enables interrupt and waits for interrupt to occur. It waits for 500ms and reports error if could not generate interrupts. Default: Enabled A4 Built In Self Test Command: bist Function: This test will run the Built In Self Test Default: Enabled A5 CAM Read/Write Test Command: camtest Function: This test will run the CAM Read/Write Test. 48 Bit patterns will be written to 64 entries of the CAM space. Test will read back the 64 entries and check. It will be tested against 5 patterns such as FFFF, 0000, 5555, AAAA, 55AA, AA55. Default: Enabled B1 LED Test Command: ledtest Function: Tests forcing of the link state for each link speed/duplex. Default: Enabled B2 EEPROM Test Command: setest Function: Reads Serial Prom and varifies integrity by checking CRC. Default: Enabled B3 MII Test Command: miitest Function: Each Register specified in the configuration contents read only bit and read/write bit defines. The test writing zero and one into the test bits to insure the read only bits value are not changed, and read/write bits are changed accordingly. Default: Enabled B4 Command: linkstatus Function: Report current link status. Default: Enabled C1 Mac Loopback Test Command: lbtest -m Function: Transmits a 2000 or specified by -lbm option of 1514-byte packets with incrementing data pattern, and checks tx and rx flags and data integrity. Default: Enabled C2 Phy Loopback Test Command: lbtest -p Function: This test is same as C1. Mac Loopback Test except, the data is routed back via physical layer device. Default: Enabled C3 External Loopback Test 100BT Command: lbtest -e Function: This test is same as C1. Mac Loopback Test except, the data is routed back via loopback device. Default: Disabled C4 External Loopback Test 10BT Command: lbtest -a Function: This test is same as C1. Mac Loopback Test except, the data is routed back via loopback device. Default: Disabled C5 Phy Loopback Test with CAM Enabled Command: camlbtest -p Function: This test is same as C2. Phy Loopback Test except, the data is routed back via physical layer device with CAM matching enabled. Default: Enabled C6 External Loopback Test 100BT with CAM Enabled Command: camlbtest -e Function: This test is same as C5. Phy Loopback Test except, the data is routed back via loopback device with CAM matching enabled. Default: Disabled C7 External Loopback Test 10BT with CAM Enabled Command: camlbtest -a Function: This test is same as C5. Phy Loopback Test except, the data is routed back via loopback device with CAM matching enabled. Default: Disabled C8 MIB MAC Loopback Test Command: mibtest Function: Test each bit of the MIB counters. By mac looping back a back to test if MIB counter bit will get incremented. Default: Enabled By default, all tests except C3, C4, C6 and C7 will be covered in manufacture mode unless disabled by user.